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25 June 2009


Accel-RF’s latest SBIR award to boost in-situ GaN device measurement

Accel-RF Corp of San Diego, CA, USA, which produces accelerated life-test/burn-in test systems for RF devices, has been awarded an SBIR (small business innovation research) contract for Topic N08-164 in cooperation with the Naval Surface Warfare Center in Crane, IN.

“Over 15 years ago, the AARTS (Automatic Accelerated Reliability Test Set) product was developed through a successful SBIR project administered by NASA,” says president & co-founder Roland Shaw. “We have significant experience with the SBIR process and this new concept is looking very promising for moving on to Phase II.” Details of the project will be released if Accel-RF is awarded a Phase II contract.

“As intrinsic reliability is proven on lower-power GaN devices, the product evolution is moving toward application of high-power MMICs, HEMT, and HFET devices that require significant advancements in reliability and performance characterization testing equipment,” Shaw adds. “This new SBIR is in keeping with this trend.”

Accel-RF has self-funded developments toward reliability testing of high-power devices, including a 200W per channel high-power reliability system, test platforms with RF- and DC-pulsing capabilities, as well as millimeter-wave reliability test systems for 30GHz and 60GHz device testing. Successful completion of this SBIR will add further in-situ measurement capability to the AARTS system platform, with direct benefits to compound semiconductor manufacturers and users, specifically the wide-bandgap initiative partners and tri-services component teams, says Accel-RF.

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