6 October 2010


LayTec delivers 1000th metrology tool

LayTec GmbH of Berlin, Germany, which provides in-situ optical metrology systems for thin-film processes, says that it has delivered its 1000th in-situ monitoring system.

Since it was founded in 1999, LayTec has supplied to industrial companies and research institutions worldwide. Initially, the firm focused on metrology solutions for III-V based compound semiconductors in telecoms applications. During 2001–2005, after adapting the product portfolio to the needs of the III-nitride market, LayTec’s EpiTT and EpiCurve TT sensors have become prevalent in gallium nitride-based LED production. The firm’s shipments of metrology tools consequently doubled from 2007 to 2008.

LayTec says that, when the current LED boom went through the roof in mid-2009, it managed to scale up its production capacity to the current market demand in just a few months. Since then, several hundred metrology systems have been shipped. Compared to 2009, the number of delivered products has hence increased by more than 300% in 2010. LayTec reckons that its share of new in-situ equipment for the MOCVD market is well above 70%.

The increase in production capacity is accredited to immediate additional investments in the firm’s production facilities. “Thanks to the high efficiency of our quality control, we managed to reconcile the fast response to growing demand with the high quality standards expected from our industrial customers,” comments production and logistics manager Dr Elmar Droege. This July, LayTec successfully renewed its Quality Management Certificate according to the DIN EN ISO 9001:2008 standard.

See: LayTec Company Profile

Search: LayTec In-situ optical metrology


For more: Latest issue of Semiconductor Today