31 May 2011

Dark Field sells inspection tools to CIGS PV firm

Dark Field Technologies Inc of Orange, CT, USA, which provides laser and camera inspection and metrology systems for the solar thin-film plastic film, displays, glass, electronics and semiconductor industries, has won an order for multiple systems worth more than $500,000 from a top-tier manufacturer of thin-film copper indium gallium (di)selenide (CIGS) photovoltaic panels.

NxtGen Scribe 100 is an on-line, real-time, 100% solar cell scribe metrology system, which is coupled with NxtGen Wash to achieve on-line haze measurement, washer debris detection, glass defects and length/width/squareness measurement.

The NxtGen Scribe 100 metrology technology uses dark-field optics and high-speed scan cameras to inspect on-line P1, P2 and P3 scribing operations. NxtGen Wash detects edge chips/cracks and broken corners/flairs, transparent conductive oxide (TCO) coating defects and washer residue, panel warp/thickness or concentrator profile at ±15 microns. More than 500 million pixels are captured and analyzed in 3 seconds.

Each Dark Field system is custom-designed and produced for individual customers, notes president Tim Potts.

Directory: Inspection equipment

Tags: Inspection tools Metrology CIGS PV

Visit: www.darkfield.com

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