27 May 2011

LayTec launches PearL in-line PL metrology system for CIGS and CdTe PV

LayTec AG of Berlin, Germany (which provides optical in-situ and in-line metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications) is launching its new PearL in-line metrology system at the Intersolar Europe 2011 event in Munich (6–10 June).

Picture: LayTec's PearL in-line PL metrology system.

As part of LayTec’s product line for solar applications, PearL is an optical in-line monitoring system measuring photoluminescence (PL) spectra of thin-film modules in production lines. The system is designed for measurements on copper indium gallium diselenide (CIGS) thin-film photovoltaic production lines. PL spectra allow fast detection of the effective gallium content of the absorber layer during the production process. A product option for cadmium telluride (CdTe) absorbers is also available.

PearL uses LayTec’s laser stimulated spectral photoluminescence (sPL) technology for PV absorber layer characterization and process control. Differently to integral imaging solutions (iPL), PearL delivers fast quantitative material parameters based on the spectroscopic response. In a production environment the continuous recording of the PL spectra is a highly valuable measurement for quality control, says LayTec.

LayTec says that PearL is a result of intensive R&D work by its engineers teamed with experienced semiconductor scientists. The firm adds that the resultant robust metrology solution can control the optical bandgap of PV absorber layers in thin-film CIGS and CdTe solar cells in industrial mass-production lines.

With PearL, LayTec is now making sPL available as an in-line tool. It can be combined with LayTec’s industry-proven SolR system which delivers, for all solar cell layers, tight uniformity control of the film deposition process from the center to the edge of each thin-film module.

Tags: LayTec Photoluminescence metrology CIGS PV CdTe PV

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