5 October 2011

Jordan Valley named one of the ‘Deloitte Israel Technology Fast 50’

For the fourth time in the last six years, x-ray and vacuum ultraviolet (VUV) metrology tool maker Jordan Valley Semiconductors Ltd (JVS) of Migdal Haemek Israel has been named one of the ‘2011 Deloitte Israel Technology Fast 50’, the ranking of the 50 fastest-growing technology companies in Israel. Rankings are based on the percentage of fiscal year revenue growth over five years.

“Since the Deloitte Brightman Almagor Zohar Fast 50 award measures sustained revenue growth over five years, being one of the 50 fastest growing technology companies in Israel is an impressive achievement,” comments Tal Chen, partner in charge of the Deloitte Brightman Almagor Zohar Israel Technology Fast 50 Program.

The growth is a testament to the wide adaptation of the firm’s x-ray metrology into advanced semiconductor manufacturing processes as well as emerging markets such as the LED and compound semiconductors, says says Jordan Valley’s founder & CEO Isaac Mazor.

The JVX6200i x-ray metrology system is a high-throughput, high-uptime and low-CoO (cost of ownership) production multi-channel metrology tool for front- and back-end-of-line (FEOL and BEOL) processes as well as wafer-level packaging (WLP) applications. The popular configuration combines x-ray fluorescence (XRF) and x-ray reflectance (XRR). Typical applications are: FEOL (high-k/metal gate, SiON and ACL hard masks), BEOL (Cu seed/barrier, Cu electroplating & CMP) and WLP (UBM stack, Sn/Ag micro bumps and Cu pillars).

The JVX7200 x-ray metrology system is claimed to be the first in-line production control tool for epitaxial SiGe and Si:C applications. It combines fast HR-XRD and fast XRR channels, capable of measuring SiGe composition, thickness, density, strain and relaxation of single- and multi-layer stacks on product wafers with high throughput, accuracy and repeatability. Unlike optical or spectroscopic tools, HR-XRD and XRR are first-principles techniques that deliver accurate and precise results without calibration, says JVS.

The QC3/QC-Velox are high-resolution x-ray diffractometers (HR-XRD) especially designed for production in-line quality control for the compound semiconductor markets such as LEDs, photovoltaics, CPV, power transistors, and RF. The tools are designed for epitaxial thin-film materials analysis, measuring thickness, composition and relaxation of epilayers such as GaN, GaAs, InP, MQW, Si, and Ge.

Tags: Jordan Valley

Visit: www.jvsemi.com

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