28 September 2011

Accel-RF launches self-contained RF characterization platform

In booth 13 at the 22nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2011) in Bordeaux, France next week (3-7 October), Accel-RF Corp of San Diego, CA, USA (which produces turn-key RF reliability testing systems for compound semiconductor devices) and distributor Peritest of Voglans, France are exhibiting Accel-RF’s new self-contained RF characterization platform, which incorporates RF source and measurement on board.

This is said to enable easy RF characterization for pseudomorphic high-electron-mobility transistor (pHEMT), field-effect transistor (FET), heterojunction bipolar transistor (HBT), monolithic microwave integrated circuit (MMIC) and micro-electro-mechanical system (MEMS) devices.

Typical applications for the platform include thermal imaging of GaN FET structures under RF stress and at elevated temperature.

Units of the new platform are shipping in fourth-quarter 2011.

Tags: Accel-RF

Visit: www.accelrf.com

Visit: www.peritest.com

Visit: http://esref2011.ims-bordeaux.fr

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