2 May 2012

LayTec launches X Link for in-line EVA laminate cross-link determination in PV modules

LayTec AG of Berlin, Germany (which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications) has launched the X Link in-line metrology system.

As part of LayTec’s product line for the photovoltaic (PV) industry, the X Link system enables fast and accurate evaluation of the degree of cross-linking in ethylene vinyl acetate (EVA) directly after lamination. It can be integrated in any crystalline silicon (c-Si) or thin-film based solar module production line, and offers 100% coverage for process and quality control, says the firm.

LayTec developed the system in close cooperation with Fraunhofer USA (a subsidiary of German research organization Fraunhofer-Gesellschaft). The method uses a rheological approach, analysing the response of the laminated EVA back-sheet combination. The measured stiffness is directly correlated with the level of cross-linking. The data can also be given as “percentage gel content” equivalent. Placed directly after the laminator, the tool gives direct feedback to the lamination process for the adjustment of heating zones and exposure times.

LayTec says that the X Link improves lamination yield through real-time control and gives a detailed proof of the long-term stability of PV modules, increasing bankability. The system replaces the common and coarse gel content test.

LayTec is presenting live demonstrations of X Link in booth 826-827, hall E 3, at the SNEC’s 6th International Photovoltaic Power Generation Conference & Exhibition (SNEC PV Power EXPO 2012) in Shanghai, China (16-18 May).

Tags: LayTec PV modules

Visit: www.laytec.de

Visit: www.snec.org.cn

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