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12 November 2012

Major Japanese manufacturer chooses DCG’s ELITE for inspecting SiC power devices

Provider of semiconductor diagnostic, characterization and defect localization solutions, DCG Systems Inc of Fremont, CA, USA says that a major Japanese power device manufacturer has purchased a DCG ELITE (Enhanced Lock-In Thermal Emission) system for the inspection of next generation silicon carbide (SiC) power devices. The system features the newly developed laser marker, full IR lens options, double-sided probing and high voltage power analysis capability. DCG did not disclose the name of the customer.

"Sensitivity of the system is much better than we had expected and beyond even some of the claimed specifications provided by DCG," stated the manager of the customer's device development department. "The new laser marker was delivered on time and its performance has been much better than what had previously been available in the market."

"We believe this solution will help customers develop faster leading edge power devices. Employing new semiconductor materials such as SiC and GaN introduce increasing development and reliability challenges. The ELITE system is helping our customers strengthen their competitive edge in this growing market," added Randy Schussler, VP and GM of the IRIS (InfaRed Imaging Systems) business unit at DCG Systems.

ELITE utilizes Lock-In Thermography (LIT) to accurately and efficiently locate defects. It incorporates the highest sensitivity thermal emission camera on the market (capable of detecting down to 20 nW of local power dissipation), high resolution Midwave Infrared (MWIR) imaging with large format InSb cameras, 3D localization for through-package imaging and stacked die analysis, and contact-less absolute temperature mapping, says the firm. Further real-time, pixel-wise IR lock-in thermography requires no post processing or integration time limitations while the custom MWIR lenses and thermal SIL (solid immersion lens) ensure highest resolution and sensitivity. Applications of ELITE beyond power devices range to general non-destructive testing (NDT). 

Tags: SiC power devices


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