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26 October 2012

AMCAD launches 1kV/ 30A pulse IV system for testing high-voltage fast-switching transistors

AMCAD Engineering of Limoges, France (which provides test and modelling tools for RF and microwave IC applications) has announced an upgrade to its PIV pulse current-voltage semiconductor device analyzer family for the next generation of high-voltage fast-switching (HVFS) transistors.

HVFS transistors open the way to new targets and new designs for high-efficiency dc-dc converters, switches, hubs and servers, telecom base-stations, and automotive applications, says AMCAD. Other applications include LED drive circuits and Class D audio amplifiers.

The firm says that new HVFS transistor technology such as enhanced-mode gallium nitride (GaN) FETs and silicon carbide MOSFETs offers very fast switching frequencies capabilities that are up to 10 times higher than previous solutions, allowing designers to use lower duty cycles.

Unfortunately, until now, there were no efficient testing solutions able to highlight the capabilities of these new technologies, which can simultaneously provide high-voltage signals and short-pulse/fast-switching capabilities, says AMCAD.

“AMCAD complements its existing pulse IV system portfolio by offering a new solution with pulse width down to 400ns@1kV to help customer testing high-voltage fast-switching transistors,” says general manager Tony Gasseling. Gasseling continued,

The 1kV/ 30A PIV High Voltage Fast Switching measurement system will be demonstrated for the first time in booth #413 at the European Microwave Week exhibition (EuMW 2012) in Amsterdam, The Netherlands (29-31 October).

Tags: GaN SiC


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