ARM Purification

CLICK HERE: free registration for Semiconductor Today and Semiconductor Today ASIACLICK HERE: free registration for Semiconductor Today and Semiconductor Today ASIA

Join our LinkedIn group!

Follow ST on Twitter


5 January 2015

CRAIC launches flexible UV-visible-NIR microspectrophotometer

CRAIC Technologies of San Dimas, CA, USA has launched the FLEX UV-visible-NIR microspectrophotometer concept, which is designed to be flexible in configuration, capabilities and pricing.

Tailored for cost-effective spectroscopic analysis of many types of microscopic samples, FLEX operates from the deep ultraviolet to the near infrared. Depending on its configuration, samples can be analyzed by absorbance, reflectance, luminescence and fluorescence with high speed and accuracy. FLEX can also be used to image microscopic samples directly with DirecVu optics and with high-resolution color digital imaging. Also, a number of packages can be added to allow measurement of ranging from the refractive index of microscopic samples to thin-film thickness.

Combined with CRAIC Technologies Traceable Standards, which are specifically designed for use with microspectrophotometers and calibrated using Standard Reference Materials from NIST, FLEX is built as a multi-functional tool for laboratories and manufacturing facilities.

FLEX integrates a sensitive spectrophotometer, high-resolution digital imaging, a UV-visible-NIR range microscope and easy-to-use software. It is designed to acquire spectra and images from microscopic samples by absorbance, reflectance, fluorescence and emission. With the high-resolution digital imaging, color photos of microscopic samples can be stored as their spectra are acquired. Additional features such as the ability to measure thin-film thickness or the refractive index can also be added.

Tags: CRAIC Technologies

Visit: www.microspectra.com/products/flex

See Latest IssueRSS Feed