ARM Purification

CLICK HERE: free registration for Semiconductor Today and Semiconductor Today ASIACLICK HERE: free registration for Semiconductor Today and Semiconductor Today ASIA

Join our LinkedIn group!

Follow ST on Twitter


6 October 2015

Bruker to acquire Jordan Valley Semiconductors

Bruker Corp of Billerica, MA, USA (a provider of scientific research instruments and analytical solutions for molecular and materials research as well as for industrial and applied analysis) has agreed to acquire the shares of x-ray-based in-line metrology and defect inspection tool maker Jordan Valley Semiconductors Ltd (JVS) of Migdal Haemek, Israel (which has subsidiaries in Durham, UK; Austin, TX, USA; Hsin-Chu, Taiwan; and Suwon, Korea).

Bruker says that the acquisition uniquely positions it to offer solutions for nanotechnology research and semiconductor metrology. With trends toward increased connectivity and access to larger amounts of data, new nanometrology needs are driving growth opportunities at advanced semiconductor nodes with even smaller features and three-dimensional structures, the firm adds.

Bruker expects that the combination and synergy between its analytical x-ray technologies and automated atomic force microscopy (AFM) systems and Jordan Valley's in-line x-ray metrology products will position its Semiconductor Division to be a leading-edge metrology system provider for semiconductor applications at advanced nodes.

Jordan Valley has been providing x-ray metrology and defect-detection technology to the semiconductor industry for 30 years, wiith 75% of the world's top 25 semiconductor manufacturers relying on its metrology tools for front-end and back-end applications, including the development of next-generation thin films. The firm's fully automated, non-contact and non-destructive tools are designed for production control on patterned or blanket wafers.

"The rapid growth of mobile technology, cloud computing and big data processing generates new requirements and opportunities for faster and more precise metrology of smaller feature sizes and 3D structures at advanced semiconductor nodes," says Mark R. Munch Ph.D., president of the NANO Group, which includes Bruker's Semiconductor Division. "Jordan Valley has been a true pioneer in offering advanced and unique x-ray metrology solutions as feature sizes continue to shrink," he comments. "The combination of Jordan Valley's core metrology strengths with Bruker's complementary x-ray technologies will enable us to stay ahead of this rapid development and continue to support the semiconductor industry with unmatched next-generation x-ray solutions," Munch believes.

"For the past several decades, Jordan Valley has been committed to providing the best non-destructive x-ray metrology products, with the most responsive service and support to semiconductor manufacturers," says Jordan Valley Semiconductors' founder & CEO Isaac Mazor. "We look forward to the enhanced product innovation and global market reach that we will enjoy within the Bruker Semiconductor Division."

The transaction is expected to close in fourth-quarter 2015, and the acquired business is expected to add $25-30m to Bruker's 2016 revenue, and about $0.01-0.02 to Bruker's 2016 earnings per share (EPS).

Tags: Jordan Valley Bruker HB-LEDs Metrology

Visit: www.bruker.com

Visit: www.jvsemi.com

See Latest IssueRSS Feed