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Semiconductor Today Magazine


13 June 2006


New SussCal software for RF and microwave device testing

Germany’s SUSS MicroTec AG has released a new version of its wafer-level, high-frequency calibration software: SussCal Professional.

According to the company, the software offers accurate, on-wafer measurements and guarantees excellent wafer-level calibration. The VNA, cables and wafer probes are calibrated using a set of well-defined standards to eliminate systematic error, moving the reference plane of the measurement to the device under test (DUT). It simplifies this calibration by using an intuitive, top-down process to guide the user through the entire set-up, from system settings to standard assignment. It also includes features like the PortMapping technology for easy set-up of complicated multiport calibration.

For measurements from DC to 110 GHz and beyond, the software includes the SUSS LRM+ calibration method. LRM+ eliminates the need for de-embedding, a process that wastes valuable space on a wafer. SussCal Professional automates the calibration process when using a semiautomatic or fully automated probe system. This means that production floor testing of RF devices becomes easier to set up and monitor, says the company.

Visit: http://www.suss.com

Contact: jpreston@sussdd.de