18 March 2010


Jordan Valley Semiconductors posts 10% year-to-year growth

For year-end 2009, X-ray metrology tool maker Jordan Valley Semiconductors Ltd (JVS) of Migdal Haemek, Israel has reported 10% year-to-year growth, rather than an anticipated 8% loss.

Despite a difficult market, JVS says the results were boosted by technology buys and repeat orders for its flagship product - the JVX6200 multi-channel metrology tools for FEOL, BEOL and wafer-level packaging (WLP) applications.

During 2009, JVS also launched three new products:

  • The JVX7200, a revolutionary tool designed for challenging SiGe process monitoring, is the first ever production-worthy tool combining HRXRD and XRR technology for strain, composition, and thickness measurement of SiGe stacks - a critical element of the sub 45 nm technology nodes, says the firm.
  • The JVX6200RD, enables high-level silicide and metal quality control, based on fast WAXRD technology.
  • The QC3, which is based on well-established diffractometery technology, is a powerful quality control solution for the emerging HB-LED market.

Isaac Mazor, CEO of JVS, said: "Although 2009 was the company's most challenging year, we forged ahead with enhancement of our product line while practicing caution and control on cash management, in order to provide the semiconductor and HB-LED industries with more powerful metrology solutions. As of Q1 2010, we are already realizing rewards from this strategy."

JVS offers a comprehensive array of tools, based on advanced XRR, XRF, HRXRD, WAXRD and SAXS technologies, ideal for both product or blanket wafers. For the compound semiconductor industry, JVS offers fast and economic HRXRD tools for high-brightness LED (HB-LED) manufacturing.

See related item:

Jordan Valley launches HR-XRD tool for LED & compound semi quality control

Bede bought by x-ray metrology equipment maker Jordan Valley

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