News: Photovoltaics
28 January 2020
Flisom chooses LayTec mapping inspection tool for CIGS PV module quality control
Flisom AG of Niederhasli, Switzerland – which was founded in 2005 as a spin-off of the Solid-State Physics of the Swiss Federal Institute of Technology Zurich (ETH Zurich) and has the Swiss Federal Laboratories for Materials Science and Technology (Empa) as a technology partner – has chosen LayTec AG of Berlin, Germany to supply an at-line mapping inspection tool for quality assurance in its copper indium gallium diselenide (Cu(In,Ga)Se2, or CIGS) thin-film production line. The metrology tool will help Flisom to maintain maximum yield in manufacturing of light-weight flexible CIGS photovoltaic modules.
LayTec’s stand-alone metrology system inspects film thickness, reflectivity, transmittance and sheet resistance by automated roll-to-roll mapping, while allowing flexible adaptation of the mapping mode. Hence, all key layers of the thin-film stack can be monitored regarding layer quality and homogeneity. This should allow Flisom to implement a tighter quality-assurance scheme and to obtain further insights into the correlation of thin-film parameters and device performance.
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