News: Suppliers
12 January 2022
k-Space achieves record annual thin-film metrology sales
k-Space Associates Inc of Dexter, MI, USA – which produces thin-film metrology instrumentation and software for research and manufacturing of microelectronic, optoelectronic and photovoltaic devices – says that it increased its 2021 thin-film metrology sales by 30% compared with 2020, making it a record sales year. This increase was due partly to robust sales of the kSA MOS UltraScan.
The kSA MOS UltraScan ex-situ metrology tool is a high-resolution scanning system that measures wafer curvature, bow and tilt. Based on proven and patented kSA MOS technology, UltraScan uses a laser array to map the two-dimensional curvature, wafer bow and stress of reflective surfaces such as semiconductor wafers, optical mirrors, glass and lenses. This technology is also available in the kSA ThermalScan model, which includes an integrated heating chamber for thermal stress analysis of wafers.
“k-Space has built a reputation for designing and producing superior metrology tools that have varying applications in both research and manufacturing settings,” says CEO Darryl Barlett. “And with the ability to customize any k-Space tool to fit each customer’s specific requirements, our customers know that their instruments will help them accomplish their research and production goals. That’s why so many of our customers come back to us when they have additional specialized metrology needs,” he adds.
