News: Suppliers
9 December 2024
Advantest announces KGD test cell for power semiconductors
Tokyo-based automated semiconductor test & measurement equipment maker Advantest Corp has announced an integrated test cell designed to maximize die-level test yields for wide-bandgap (WBG) devices essential to power semiconductors. The Advantest Known Good Die (KGD) Test Cell combines the firm’s CREA MT series power device testers with the new HA1100 die prober.
Picture: Advantest’s Known Good Die (KGD) Test Cell, combining CREA MT series power device testers with the new HA1100 die prober.
Screening for failures in WBG devices is challenging, as the probe card, chuck and devices can be damaged due to the high voltage and current at which they operate, notes Advantest. Essentially serving as a one-stop shop for efficient equipment management, the Advantest KGD test cell helps to reduce customers’ manufacturing costs, claims the firm, as CREA’s proprietary probe card interface (PCI) technology can eliminate damage risk. However, if damage does occur, Advantest can investigate it using the test cell, allowing customers to minimize downtime. The HA1100 die prober for the CREA MT series test systems enables the assembly of dies in power modules using only passed (KGD) die, ensuring that no failed die find their way into the module. This prevents yield loss at module test, reducing the loss of final multi-die assembled power modules.
“Our new KGD test cell is the first solution to combine the CREA MT testers with Advantest’s proven handling technology, enabling dynamic test at the die level,” says Kazuyuki Yamashita, executive VP, DH Group, Advantest. “The CREA PCI technology regulates power/energy to protect the probe card, the chuck and the devices from damage while testing failing die – a competitive differentiator that lets customers assemble their modules with confidence,” he adds.
Currently under development, the HA1100 die prober will be released to the global market in second-quarter 2025.
Advantest is exhibiting in booth 1648 at SEMICON Japan 2024 at Tokyo Big Sight (11-13 December).
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