AES Semigas

Honeywell

17 March 2025

Keysight adds wide-bandgap power semiconductor bare chip dynamic measurement to double-pulse test portfolio

Keysight Technologies Inc of Santa Rosa, CA, USA has enhanced its double-pulse test portfolio, enabling customers to benefit from accurate and easy measurement of the dynamic characteristics of wide-bandgap (WBG) power semiconductor bare chips. The technologies implemented in the measurement fixture minimize parasitics and do not require soldering to the bare chip. The fixtures are compatible with both versions of Keysight’s double-pulse testers.

Characterizing the bare chip before packaging expedites development. However, measuring the dynamic characteristics of a power semiconductor bare chip by traditional methods requires soldering directly onto the bare chip before tests can be performed. This is not only difficult but it can introduce parasitics that will introduce errors into the measurements.

The new Keysight bare chip dynamic measurement solution helps power semiconductor device engineers and power electronics engineers to perform dynamic characterization as soon as a chip is diced from a wafer. The innovative design of the fixture allows quick accommodation of bare chips and provides sufficient electrical contact while preventing a small and fragile bare chip from arcing or being damaged. The unique fixture structure, which doesn’t use probing, wire bonding or soldering, minimizes parasitics in the test circuit (yielding power-loop inductance less than 10nH) and produces clean measurement waveforms for fast-operating WBG power semiconductor devices.

“With the introduction of the new WBG semiconductor bare chip evaluation method, we are helping the industry expedite the development of highly efficient and robust power semiconductor discrete devices and power modules,” says Thomas Goetzl, VP & general manager for Keysight Automotive & Energy Solutions. “Bare chip dynamic characterization, once regarded as almost impossible to do, is now possible with the extension to our power semiconductor test portfolio.”

Keysight is exhibiting in booth #829 at the IEEE Applied Power Electronics Conference & Exposition (APEC 2025) in the Georgia World Congress Center, Atlanta, GA, USA (16–20 March).

See related items:

Keysight unveils 3kV high-voltage wafer test system for power semiconductors

Tags: Keysight

Visit: www.apec-conf.org

Visit: www.keysight.com

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