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Honeywell

20 March 2026

Warwick secures funding to boost UK wide-bandgap power semiconductor reliability testing

The University of Warwick has secured new funding to boost the UK’s ability to test the reliability of advanced semiconductors used in electric vehicles, renewable energy, and other critical technologies.

The funding will support the purchase of a wide-bandgap (WBG) dynamic reliability & robustness tester system from UK-based manufacturer ipTEST Ltd, which will enable researchers to put next-generation power semiconductor devices through extreme test conditions to see how they perform, and when they fail.

Since devices made from wide-bandgap semiconductor materials such as silicon carbide (SiC) and gallium nitride (GaN) are central to modern electrification (improving efficiency, enabling faster charging, and supporting power systems across transport, energy and aerospace), ensuring their reliability is vital, particularly in safety-critical applications.

“This award is transformative for the University of Warwick and the REWIRE IKC [Innovation and Knowledge Centre]. By enabling fast, repeatable and industry-aligned reliability testing, this equipment will allow us to build the UK’s first comprehensive SiC and GaN reliability database,” says professor Peter Gammon, REWIRE IKC lead at the University of Warwick. “It also provides a foundation for new commercial services that will support UK manufacturers, SMEs, and international device suppliers alike.”

Access to advanced reliability testing remains limited in the UK, particularly for smaller companies. The new facility at Warwick aims to help address this gap by providing high-quality, independent testing that businesses can trust.

By simulating real-world stresses — such as high voltages and fault conditions — the system will help researchers and industry partners to better understand device performance, reduce failure risk, and accelerate innovation.

The system forms part of the £12m REWIRE Innovation and Knowledge Centre (IKC), the UK’s national centre for wide-bandgap semiconductor reliability and represents a major addition to national capability.

The investment is expected to:

  • strengthen UK research through one of the most comprehensive reliability datasets;
  • support industry growth by enabling faster, more confident product validation; and
  • establish a national testing service for UK manufacturers and innovators.

The new equipment will be housed in Warwick’s Driving the Electric Revolution – Innovation Centre (DER-IC). It is expected to be fully operational by April and will be available to academic and industry users across the UK through established booking pathways.

See related items:

UK’s £11m REWIRE Innovation and Knowledge Centre to develop wide/ultrawide-bandgap high-voltage power electronics

Tags: Semiconductor test instrument

Visit: www.iptest.com

Visit: go.warwick.ac.uk/peater

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