8 July 2022
Thin-film metrology system maker k-Space celebrates 30th anniversary
k-Space Associates Inc of Dexter, MI, USA – which was founded in 1992 and produces thin-film metrology instrumentation and software for research and manufacturing of microelectronic, optoelectronic and photovoltaic devices – is celebrating 30 years of helping the world’s leading technology makers develop, monitor, control and manufacture their products in the thin-film, semiconductor, solar and glass markets, to name a few.
“After 30 years it’s still so satisfying to walk into a laboratory or a manufacturing facility and see our metrology tools being used in real-time for process monitoring and control,” comments CEO Darryl Barlett.
k-Space’s thin-film metrology applications employ patented methods to accurately measure and monitor wafer temperature, stress, curvature, bow, deposition rate, thickness, reflectivity, spectral reflectance and transmission, and reflection high-energy electron diffraction (RHEED).
On the industrial metrology side, k-Space’s tools are used in production facilities worldwide to measure precise part features, surface defects and more to ensure high yield and quality compliance.
Such measurements are vital for the manufacturing of semiconductor chips, solar panels, architectural glass, building materials, and other products.
k-Space has distributors in Europe, India, China, Japan, South Korea, and throughout the world. The firm says that, through extensive customer input, close collaboration with its worldwide customer base, and a strong commitment to technical support, it continues to develop new solutions that help its customers fulfill even their most complex metrology needs.